Schottky Field Emission Scanning Electron Microscope SU5000

State: Out of stock

With a New User Interface, Provides High-quality Images for Every User

A scanning electron microscope is a tool that can be used in a wide variety of fields such as nanotechnology, materials, medicine and life sciences.
Recently, although there have been marked developments in the functions and capabilities of the scanning electron microscope, the types of users are also expanding and so there is demand for a microscope that can acquire data by using these functions and capabilities independent of the user's level of skill.
Furthermore, there is now also a diversification in the types of observation samples, and as a result there are increasing needs for microscopes that allow observations to be made with as few limitations as possible as regards such aspects as sample size and characteristics.

Warranty: 12 tháng

Price: Contact us

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Delivery time: 8h00 - 18h00 daily
Genuine product, provided width CO, CQ
03 months of free warranty for consumable and accessories
12 months of free warranty for main equipment
Accessorie's price is applied only when purchased with
main equipment
Contact us for any particular accessory's quotion

Email: info@redstarvietnam.com Every day in week

Features
Specifications
Comments

● Incorporates the newly developed user interface EM Wizard, which provides every type of user with good levels of high resolution, repeatability and throughput
● Incorporates an automatic axis adjustment technology (auto-calibration) that can restore the microscope to its "best condition" state whenever necessary
● Designed to reduce as much as possible any limits as regards the observation sample, and employs a "draw out" specimen chamber that is compatible with

large specimens(-200 mmφ, -80 mmH)
● The time required from the start of evacuation until making an observation is within 3 minutes of the maximum level for field emission scanning electron microscopes

Application Data

Sample: Zinc Oxide powder
V-land: 1 kV, Mag.: 120,000x
High resolution TOP detector image
obtained at low kV (1 kV)

Sample: PTFE
Vacc: 3 kV, Mag.: 13,000x
UVD providing high quality image at low kV
(3 kV) and low vacuum (40 Pa)

Items		Description
Spatial Resolution		1.2 nm @ 30 kV 3.0 nm @ 1 kV 2.0 nm @ 1 kV with deceleration mode^1 3.0 nm @ 15 kV Variable Pressure mode^2
Magnification		10 - 600,000x (based on 4 "x 5 "picture), 18 - 1,000,000x (800×600 pixels on display) / 30 - 1,500,000x (1,280x960 pixels on display)
Electron Optics	Emitter	ZrO /W Schottky emitter
	Acceleration Voltage	0.5 - 30 kV (0.1 kV step)
	Landing Voltage	0.1 - 2.0 kV with deceleration mode^＊¹
	Maximum Probe Current	>200 nA
Detector		Evehart Thonley SE detector(Lower detector)
Variable Pressure Mode^*2		Pressure Range : 10 - 300 Pa
Traverse range	Control	5-Axis motorized stage
	Movement	X：0～100mm Y：0～50mm Z：3～65mm T：-20～90° R：360°
	Specimen Size	up to 200 mmΦ、maximum 80 mm height
Optional Detectors		Top detector for high resolution imaging Through-the-Lens^2 Ultra Variable-Pressure Detector (UVD) Retractable five segment Backscatter Electron Detector (PD-BSD)^3 Energy Dispersive X-ray detector (EDS) Wavelength Dispersive X-ray detector (WDS) Electron Backscatterd Diffraction Pattern detector (EBSD)