Ultra-High-Resolution Schottky Scanning Electron Microscope SU7000

State: In stock

SU7000: The Next-Generation FE-SEM

The modern FE-SEM requires not only high performance but also a multitude of functionalities including wide-area observation, in-situ analysis, variable pressure, high-resolution imaging at low accelerating voltages, and simultaneous multi-signal collection.

The SU7000 is designed to address these aspects and more by delivering enhanced information for diversified needs in the field of electron microscopy.

Experience the nano-world with the SU7000!

Warranty: No warranty infomation

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Delivery time: 8h00 - 18h00 daily
Genuine product, provided width CO, CQ
03 months of free warranty for consumable and accessories
12 months of free warranty for main equipment
Accessorie's price is applied only when purchased with
main equipment
Contact us for any particular accessory's quotion

Email: info@redstarvietnam.com Every day in week

Features
Specifications
Comments

Versatile Imaging Capability

The SU7000 excels in fast acquisition of multiple signals to address expansive SEM needs, from imaging a wide field of view to visualizing sub-nanometer structures and everything in between.
The incorporation of newly designed electron optics and detection systems allows for efficient simultaneous acquisition of multiple secondary electron and back-scattered electron signals.

Multi-Channel Imaging

The number of the detectors mounted on the SEM is ever increasing, along with the need to display all collected information effectively.
The SU7000 is capable of processing, displaying, and saving up to 6 signals simultaneously to maximize information acquisition.

Wide Variety of Observation Techniques

The specimen chamber and the vacuum system are optimized for:

Large specimen size
Sample manipulation at various axes
Variable pressure conditions
Cryogenic conditions
Heating and cooling in-situ observation

Microanalysis

The electron gun is equipped with a Schottky emitter that provides up to 200 nA beam current to accommodate various microanalysis applications.
The specimen chamber and port layout are designed to incorporate multiple analytical options including EDX, WDX, EBSD, cathodoluminescence, and more.
The SU7000 with the combination of numerous analytical accessories unifies multi-discipline techniques in a single platform.

Image Resolution	Resolution SE		0.8 nm@15 kV
Image Resolution	Resolution SE		0.9 nm@1 kV
Magnification			20～2,000,000 x
Electron Optics	Emitter		ZrO/W Schottky Emitter
	Accelerating Voltage		0.1～30 kV (0.01 kV step)
	Probe Current		Max. 200 nA
Detectors	Standard Detectors		UD（Upper Detector)
			MD（Middle Detector）
			LD（Lower Detector)
	Optional Detectors		PD-BSED（Semiconductor type）
	Optional Detectors		UVD (Ultra Variable Pressure Detector）
Variable Pressure(VP) Mode (Option)	Pressure Range		5～300 Pa
Variable Pressure(VP) Mode (Option)	Available Detectors in VP mode		PD-BSED, UVD, UD, MD,LD
Specimen Stage	Stage Control		5-axis Motor Drive
	Movable Range	X	0～135 mm
		Y	0～100 mm
		Z	1.5～40 mm
		T	-5～70°
		R	360°
Specimen Chamber	Specimen Size		Max. φ200 mm, Max. 80mm Height
Monitor（Option)			23 inch LCD（1,920×1,080) , supports dual monitors operation
Image Display Mode	Large Screen Display Mode		1,280×960 pixels
	Single Image Display Mode		800×600 pixels
	Dual Image Display Mode		800×600 pixels、1,280×960 pixels with dual monitors
	Quad Image Display Mode		640×480 pixels
	Hex Image Display Mode w/dual monitors		640×480 pixels with dual monitors
Image Data Saving	Pixel Size		640×480、1,280×960、2,560×1,920、5,120×3,840、10,240×7,680
Optional Accessories	Energy Dispersive X-ray Spectrometer (EDX)
	Wavelength Dispersive X-ray Spectrometer (WDX)
	Electron Backscattered Diffraction Detector (EBSD)
	Cathodoluminescence System (CL)
	Cryogenic Transfer System
	Compatible with various types of sub-stages