Leica EM RES102

State: Out of stock

Thin, clean, polish, cut slopes and structure your samples with the highest level of flexibility in the Leica EM RES102. The unique ion beam milling system combines the preparation of TEM, SEM and LM samples in one single benchtop unit.

Warranty: 12 tháng

Price: Contact us

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Delivery time: 8h00 - 18h00 daily
Genuine product, provided width CO, CQ
03 months of free warranty for consumable and accessories
12 months of free warranty for main equipment
Accessorie's price is applied only when purchased with
main equipment
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Ion Beam Milling System Leica EM RES102

A variety of sample holders allows a diverse range of applications to be carried out. In addition to high-energy ion beam milling, the Leica EM RES102 can also be used for very gentle sample processing using low ion energy.

For research use only

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Ion Beam Milling System Leica EM RES102

Your Advantages

Effective and Cost efficientn One system for TEM, SEM and LM applications SEM preparation of samples up to 25 mm diameter Improved effectiveness in TEM sample preparation with the production of large electron transparent areas for TEM analysis LAN capability for remote control and monitoring	Safe Fully program controlled motorized ion source and sample movements for reproducible results
Native specimens LN2 sample stage cooling to maintain the integrity of temperature sensitive samples	Easy operation Integrated applications library Integrated helpfiles and tutorial videos for beginners and maintenance