Ion Beam Milling System Leica EM TIC 3X
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Achieving high quality cross-sections of almost any material, revealing the internal structures of the sample with scarcely any deformation or damage was never before more convenient than now, using the Leica EM TIC 3X.
The Triple Ion Beam Milling System, Leica EM TIC 3X allows production of cross sections of hard/soft, porous, heat sensitive, brittle and heterogeneous material for Scanning Electron Microscopy (SEM), Microstructure Analysis (EDS, WDS, Auger, EBSD) and, AFM investigations.
Three individually controlled ion beams , rotary stage, cooling stage and multiple sample stage ensure milling at high rates, cutting broad and deep into the sample resulting in high quality cross-sections.
Connectivity with the Leica transfer system provides for perfect cryogenic surfacing of biological, geological or industrial samples subsequently transferred under cryo and vacuum conditions to coaters and (cryo) SEM.
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Your Advantages
![]() Vacuum Transfer Docking PortThe VCT docking port in combination with the Leica EM TIC3X offers the perfect workflow for surfacing environmentally sensitive samples which can be subsequently transferred to coating and/or SEM systems under inert gas/vacuum conditions More information Take a look at the latest publication
(SEM cross sections were obtained using the Leica EM TIC3X/VCT) |
![]() Sample HoldersA choice of various sample holders for almost every sample size ensures best possible flexibility for users. Take a look at the sample holders |
![]() Top-rate PerformanceUnique Triple Ion Beam System optimizes the cross-section quality and reduces working time with its ability to cut broad and deep at high speeds. Up to three samples can be processed in one session. This makes the Leica EM TIC 3X a perfect instrument for high through-put laboratories |
![]() Configurable SystemDepending on your preparation needs the Leica EM TIC 3X can be configured individually by using interchangeable stages - Standard stage, Multiple sample stage, Rotary stage, Cooling stage or VCT Docking Station. Take a look at the stages |
Clear Visualization of the Surface TopographyIn addition to cross sectioning, the same holder can be used for cleaning and contrast enhancement.
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Rotary stage (retrofittable) has specially been designed for large area milling (flat milling). The ion beam prepared area is exeeding Ø 25 mm.
Standard stage for routine applications and contrast enhancement of the prepared surface.
Multiple sample stage is used if high throughput is desired. Three samples can be loaded and automatically processed in the Leica EM TIC 3X in one session (e.g. overnight) without any user interaction.
Cooling stage provides very low temperature processing. With temperatures of the sample holder and mask down to -160°C, extremely heat sensitive samples such as rubber, water soluble polymer fibers or even marshmallows (if desired) can be processed to a high quality.
Perfect for surfacing environmentally sensitive samples which can be subsequently transferred to coating and/or SEM systems under inert gas/vacuum conditions
Various sample holders for almost every sample size and a wide range of use are available e.g. one sample holder for the complete process from mechanical pre-preparation (Leica EM TXP) to ion beam slope cutting (Leica EM TIC 3X) to SEM investigation to the point of storage.
Sample holders for samples up to 12 mm height as well as adaptors for commercial available SEM stubs