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Thiết bị ăn mòn bằng chùm tia Ion Leica EM TIC 3X

Thiết bị ăn mòn bằng chùm tia Ion Leica EM TIC 3X

Model:
Tình trạng: Liên hệ
The Triple Ion Beam Cutter, Leica EM TIC 3X allows production of cross sections of hard/soft, porous, heat sensitive, brittle and heterogeneous material for Scanning Electron Microscopy (SEM), Microstructure Analysis (EDS, WDS, Auger, EBSD) and, AFM investigations.
Bảo hành: 12 tháng


Giá bán: Liên hệ




Đặt hàng
  • Khung giờ giao hàng từ 8h00 - 18h00 hàng ngày.
  • Sản phẩm chính hãng, cung cấp CO & CQ.
  • Bảo hành miễn phí 03 tháng với hàng hóa tiêu hao và phụ kiện.
    Bảo hành miễn phí 12 tháng với máy chính.
  • Giá trên chỉ áp dụng đối với mặt hàng có sẵn.
    Đối với mặt hàng không có sẵn sẽ tính thêm phí vận chuyển.
Gọi đặt hàng tư vấn 096-256-8811            Tất cả các ngày trong tuần

Ion Beam Milling System Leica EM TIC 3X

 

Achieving high quality cross-sections of almost any material, revealing the internal structures of the sample with scarcely any deformation or damage was never before more convenient than now, using the Leica EM TIC 3X.

 

The Triple Ion Beam Milling System, Leica EM TIC 3X allows production of cross sections of hard/soft, porous, heat sensitive, brittle and heterogeneous material for Scanning Electron Microscopy (SEM), Microstructure Analysis (EDS, WDS, Auger, EBSD) and, AFM investigations.

 

Three individually controlled ion beams , rotary stage, cooling stage and multiple sample stage ensure milling at high rates, cutting broad and deep into the sample resulting in high quality cross-sections.

 

Connectivity with the Leica transfer system provides for perfect cryogenic surfacing of biological, geological or industrial samples subsequently transferred under cryo and vacuum conditions to coaters and (cryo) SEM.

 

 

  Liên hệ với chúng tôi

info@redstarvietnam.com       091-5567-885

  

 Leica EM TIC 3X

 

 

Your Advantages

 

 

Vacuum Transfer Docking Port

The VCT docking port in combination with the Leica EM TIC3X offers the perfect workflow for surfacing environmentally sensitive samples which can be subsequently transferred to coating and/or SEM systems under inert gas/vacuum conditions

 

More information

 

Take a look at the latest publication

 

(SEM cross sections were obtained using the Leica EM TIC3X/VCT)

  

Sample Holders

A choice of various sample holders for almost every sample size ensures best possible flexibility for users.

 

Take a look at the sample holders
 

Top-rate Performance

Unique Triple Ion Beam System optimizes the cross-section quality and reduces working time with its ability to cut broad and deep at high speeds. Up to three samples can be processed in one session. This makes the Leica EM TIC 3X a perfect instrument for high through-put laboratories

  

Configurable System

Depending on your preparation needs the Leica EM TIC 3X can be configured individually by using interchangeable stages - Standard stage, Multiple sample stage, Rotary stage, Cooling stage or VCT Docking Station.

 

Take a look at the stages

Clear Visualization of the Surface Topography

In addition to cross sectioning, the same holder can be used for cleaning and contrast enhancement.

 

  
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Rotary Stage

Rotary stage (retrofittable) has specially been designed for large area milling (flat milling). The ion beam prepared area is exeeding Ø 25 mm.

 

Standard Stage

Standard stage for routine applications and contrast enhancement of the prepared surface.

 

Multiple Sample Stage

Multiple sample stage is used if high throughput is desired. Three samples can be loaded and automatically processed in the Leica EM TIC 3X in one session (e.g. overnight) without any user interaction.

 

Cooling Stage

Cooling stage provides very low temperature processing. With temperatures of the sample holder and mask down to -160°C, extremely heat sensitive samples such as rubber, water soluble polymer fibers or even marshmallows (if desired) can be processed to a high quality.

 

Vacuum transfer docking station

Perfect for surfacing environmentally sensitive samples which can be subsequently transferred to coating and/or SEM systems under inert gas/vacuum conditions

 

 

Sample Holders

Various sample holders

Various sample holders for almost every sample size and a wide range of use are available e.g. one sample holder for the complete process from mechanical pre-preparation (Leica EM TXP) to ion beam slope cutting (Leica EM TIC 3X) to SEM investigation to the point of storage.

 

Sample holders for rotary stage

Sample holders for samples up to 12 mm height as well as adaptors for commercial available SEM stubs

 

Sample holders for high pressure frozen samples

Several holders are available fro high pressure frozen samples.
Image left side - Cryo sample holder
Image right side - Cryo sample holder for samples up to 10 x 7 x 4 mm