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Scanning Electron Microscope S-3400N
Red Star Vietnam Co., Ltd.
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Scanning Electron Microscope S-3400N

State: In stock
The new Hitachi S-3400N Variable Pressure SEM has been developed by improving the design of the S-3000N VP SEM which has been well accepted in the world market. It allows the study of wet, oily, and/or non-conductive samples without metal coating or other complicated specimen preparation techniques.
New hardware and software functions have been developed after listening to our user's requests for better imaging, larger sample sizes, analytical capabilities,higher throughput and easy to use.

Better electron optics, larger specimen chamber, faster, cleaner evacuation system and fully automated software are just a few of the new features of the S-3400N. Due to a newly designed TMP evacuation system, no cooling water is necessary. It takes less than 100 seconds to exchange a specimen and 6 minutes to reach ready status from a cold start. It requires only 2.0 kVA for the power supply. The S-3400N will be a new world standard in the middle class Variable Pressure SEM.
Warranty: 12 tháng


Price: Contact us




Order
  • Delivery time: 8h00 - 18h00 daily
  • Genuine product, provided width CO, CQ
  • 03 months of free warranty for consumable and accessories
  • 12 months of free warranty for main equipment
  • Accessorie's price is applied only when purchased with
    main equipment
  • Contact us for any particular accessory's quotion
Email: info@redstarvietnam.com Every day in week

● Revolutionary automatic alignment functions (Auto Beam Setting, Auto Aperture Alignment, etc.)
● Better resolution of 10 nm at 3 kV
● Real time full screen image, dual image and signal mixing
● Newly developed high sensitivity solid state type BSE detector
● Computer eucentric, 5-axes motorized stage with -20/+90 degrees tilt (Type II)
● Can accommodate samples as tall as 80 mm for elemental analysis(Type II)
● Analytical specimen chamber with optimum geometry for simultaneous accommodation of EDS, WDS and EBSD
● High throughput, less floor space, less electric power consumption, with no cooling water requirement due to TMP evacuation system



 S-3400N TYPE I

 

 

 S-3400N TYPE II

 

Items

Description

Resolution

SE

3.0 nm at 30 kV (High Vacuum Mode)

10 nm at 3 kV (High Vacuum Mode)

BSE

4.0 nm at 30 kV (Low Vacuum Mode)

Magnification

×5 - ×300,000

Accelerating Voltage

0.3 - 30 kV

Low Vacuum Range

6 - 270 Pa through graphic menu

Image Shift

±50 µm at WD = 10 mm

Maximum Specimen Size

200 mm in diameter

Specimen Stage

 

TypeI

TypeII

X

0 - 80 mm

0 - 100 mm

Y

0 - 40 mm

0 - 50 mm

Z

5 - 35 mm

5 - 65 mm

R

360°

360°

T

-20 - 90°

-20 - 90°

Maximum Height

35 mm at WD = 10 mm

80 mm at WD = 10 mm

Observable area

105 mm in diameter

130 mm in diameter

Mortorized

manual

5 axes in standard

Electron Optics

Electron Gun

Precentered Cartridge Filament

Objective Aperture

Click Stop Movable Aperture with 4 openings

Gun Bias

Quadrant Bias

Detectors

Secondary Electron Detector High Sensitivity Semiconductor BSE Detector

Analytical Position

WD = 10 mm, TOA = 35°

Display

Language

English

OS

Windows®XP

Controls

Mouse, Keyboard and Rotary Knob Set

Monitor

19 type LCD(to be changed without notice)

Auto Alignment

Auto Beam Setting, Auto Axial Alignment

Auto Image Adjustment

Auto Focus, Auto Stigmator/Focus Auto Brightness & Contrast

Image Data Saving

640 × 480 pixels, 1,280 × 960 pixels, 2,560 × 1,920 pixels, 5,120 × 3,840 pixels

Image Filing

Search Functions/Built-in Image Data Base with Image Processing Functions

Filing Format

BMP, TIFF, JPEG

Auto Data Display

Accelerating Voltage, Magnification, Micron Marker, Unit, Film Number, Working Distance, Date/Time, Detector, Pressure

Image Display Mode

Full Screen Display: 1,280 × 960 pixels
Small Screen Display: 640 × 480 pixels
Dual Image Display: 640 × 480 pixels ×2
Signal Mixing

Evacuation System

Operation

Full Automatic Sequence

Turbo Molecular Pump

210 L/Sec. × 1

Oil Rotary Pump

135 L/Min.(162 L/Min.with 60 Hz) × 1

Protection

Power Failure and Vacuum Failure

Auxiliary Functions

Raster Rotation

Dynamic Focus/Tilt Compensation

Dynamic Stigmonitor

Free Layout Print Function

3D Animation Maintenance Guide

Easy Measurement

Oblique image

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