FISCHERSCOPE® X-RAY XDV®-SDD

State: Out of stock

High performance X-ray fluorescence (XRF) measuring system with a programmable XY-stage and Z-axis for automated measurements of very thin coatings and for trace analysis

Warranty: No warranty infomation

Price: Contact us

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Delivery time: 8h00 - 18h00 daily
Genuine product, provided width CO, CQ
03 months of free warranty for consumable and accessories
12 months of free warranty for main equipment
Accessorie's price is applied only when purchased with
main equipment
Contact us for any particular accessory's quotion

Email: info@redstarvietnam.com Every day in week

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Premium model with universal application characteristics
Highest excitation flexibility, for both the size of the measurement spot and the spectral composition
With the silicon drift detector, even very high intensities> 100 kcps can be processed without a loss in energy resolution
Very low detection limits and excellent repeatability
Large and easily accessible measurement chamber
Automated series testing with fast, programmable XY-stage

Typical fields of application

Inspection of very thin coatings, e.g. in the electronics and semiconductor industries
Trace analysis, e. g. detection of harmful substances, according to RoHS, toy standards, packaging standards
Gold and precious metal analysis with highest precision
Photovoltaic industry
Measurement of thickness and composition of NiP-layers

BROC_XDV-SDD_en.pdf