Ultra-high Resolution Scanning Electron Microscope SU8010

State: In stock

Powerful lineup for ultra high resolution microscopy.

Nanotechnology tool, such as semiconductors, electronics, catalysis and other functional materials, biotechnology and pharmaceuticals are being researched world-wide as core competencies for next generation cutting-edge technologies. Ultra High Resolution FE-SEM has grown to be an indispensable tool to observe the fine surface structure of materials in a wide range of nanotechnology fields. Hitachi High-Tech has newly developed the SU8010 Series to fulfill tomorrow,s market needs.
The new SU8000 Series has excellent imaging performance in common, and off ers a variety of stages, chambers and signal detection systems to meet the wide variety of customer-specific needs for ultra high resolution microscopy.

Warranty: 12 tháng

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Delivery time: 8h00 - 18h00 daily
Genuine product, provided width CO, CQ
03 months of free warranty for consumable and accessories
12 months of free warranty for main equipment
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main equipment
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Features
Specifications
Comments

● Ultra-high resolution imaging at ultra low accelerating voltage (SE resolution 1.3 nm at landing voltage 1.0 kV)
● A wide range of signal detection system
● User-friendly GUI and wide monitor for comfortable operation
● Wide range of optional accessories to meet customer-specific needs

Secondary Electron Image Resolution			1.0 nm (Vacc 15 kV, WD=4 mm)^*1
			1.3 nm (landing voltage 1kV, WD=1.5 mm)^*1
Mag	Low mag mode		20-2,000x (Magnification on Photo)^*2
			80-5,000x (Magnification on display)^*3
	High mag mode		100-800,000x (Magnification on Photo)^*2
			400-2,000,000x (Magnification on display)^*2
Electron Optics	Electron gun		Cold cathode field emission source
	Accelerating voltage		0.5 kV to 30 kV (Standard mode)
	Landing voltage		0.1 kV to 2.0 kV (Deceleration mode)
	Objective lens aperture		Objective aperture (Heating type), 4 openings, selectable from outside of vacuum
Electrical Image Shift			±12 µm (WD=8 mm)
Specime Stage	Stage Control		3-axis motor drive
			5-axis motor drive^*4
	Traverse range	X	0-50 mm
		Y	0-50 mm
		R	360°
		T	-5-70°
		Z	1.5-30 mm
	Max. sample size		100 mm (Maximum)
			150 mm dia.^*4
Detector	Secondary electron detector		Lower/Upper
			SE/BSE Signal Mixing Function (Upper detector)
	Backscattered Electron Detector		Semiconductor type BSED^*4
			YAG BSED^*4
	Transmission Electron Detector		STEM detector (for BF-STEM)^*4
			BF-STEM aperture^*4
			DF-STEM holder^*4
	Other		Energy dispersive X-ray spectrometer^*4
			Faraday cup^*4
			EBIC image observation unit^*4