Four Circle X-Ray Diffractometer ARL EQUINOX 6000

State: Out of stock

The Thermo Scientific™ ARL™ EQUINOX 6000 is a multi purpose X-ray diffractometer designed specifically for high level research applications. The system utilizes an unique tall vertical goniometer in θ/θ or θ/2θ mode with an attached high precision Eulerian cradle. It is the perfect diffraction system for materials science including thin layer analysis, reflectometry, micro diffraction, residual stress analysis, texture measurements. Data is measured in “real time,” which present many advantages in kinetics experiments or combined analyses.

Warranty: No warranty infomation

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Delivery time: 8h00 - 18h00 daily
Genuine product, provided width CO, CQ
03 months of free warranty for consumable and accessories
12 months of free warranty for main equipment
Accessorie's price is applied only when purchased with
main equipment
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Features
Specifications
Downloads
Comments

{001}, {100} and {111} pole figuresrecalculated from the OD refined by combinedanalysis for the a) as-cast and b) cast andsintered PZT samples synthetised by the purePbO flux route. Linear density scale, equalarea projection.

• Real time acquisition

• Extremely accurate

• Easy to use

• No alignment needed

• Very reliable

• Superb resolution

• No maintenance

4 circle diffractometer in horizontal configuration with dual X-ray source (Cu / Mo)and dual detection (XRD / XRF).

Multi axis sample handling thinfilm attachment.

4 circle high temperature attachment

DHS 1100, dome hot stage for 4 circle goniometersNon ambient X-ray studies up to 1100°C.

Applications:

Research

Environment / Geology

Polymers / Biomaterials

Metallurgy

Electronics

Photovoltaic

X-ray source	Generator: 3500 W (60kV/60mA - Option 30kV limitation Standard sealed X-Ray tube (Cu, Co, Cr, Mo, ... radiation)
Detector	Curved Position Sensitive X-ray Detector, CPS120 Curvature radius: 250mm Acquisition in real time over 120° 2Theta Option: CPS590 (500mm, 90° 2Theta)
Goniometric table	Theta / Theta or Theta / 2 theta column Centered Eulerian Cradle, Chi 180° / Phi rotation Motorization per step with encoder, up to 5/10000° Acquisition in asymmetric mode
Sample holders	Bulk, Thin film, Powder Reflection or transmission mode Zero background sample cup Support with adjustment in heigh and oscillation Mapping attachement (X, Y translations)
In-situ camera	High and low temperature attachment Tensile stage
Optic	Monochromatic (Germanium, Graphite or X-ray mirror Collimation device (collimator, X-ray capillary)
Computer	Windows© 8, 7 Vista, XP
Software	Simultaneous data acquisition in real time Combined analysis - Texture, stress, reflectivity, phase, ... Texture analysis - Graphic analysis of ODF, PFs, IPFs, ... Stress analysis - Scan Phi or sin2(Psi) Reflectivity fitting by various models Thin film and multilayer analysis (Film thickness, absorption models, ...) Peak search and deconvolution with several shapes Microstructure analysis Search match and quantification Degree of crystallinity determination Cell parameters, crystallite size, lattice strain Crystal structure analysis Microstructure analysis Rietveld analysis Phase transition, dynamic studies Free open database, COD Option : ICDD PDF2 or PDF4 databases
Power	30-32A / 208-230V / 50-60 Hz
Cooling water	Flow: ≈ 3,5 L/min - T°C: ≈18 to 25 °C
Weight	~500 kg
Dimensions	1966 mm H x 1145 mm D x 1433 mm W