Field Emission Transmission Electron Microscope HF5000

State: In stock

Hitachi's unique 200 kV aberration-corrected TEM/STEM: the perfect harmony of imaging resolution and analytical performance

0.078 nm spatial resolution in STEM is achieved together with high specimen-tilt capability and large solid angle EDX detector(s), all in a single objective lens configuration.
The HF5000 builds on features from Hitachi HD-2700 dedicated STEM including Hitachi's own fully automated aberration corrector, symmetrical dual SDD EDX and Cs-corrected SE imaging. It also incorporates the advanced TEM/STEM technologies developed in the HF series.
Integrating these accumulated technologies into a new 200 kV TEM/STEM platform results in an instrument with an optimum combination of sub-Å imaging and analysis, as well as the flexibility and unique capabilities to address the most advanced studies.

Warranty: No warranty infomation

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Genuine product, provided width CO, CQ
03 months of free warranty for consumable and accessories
12 months of free warranty for main equipment
Accessorie's price is applied only when purchased with
main equipment
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Features
Specifications
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Features

Hitachi fully automated probe-forming spherical aberration corrector
High-brightness and high-stability cold FE electron gun (Cold FEG)
Ultra-stable column and power supplies for enhanced instrument performance
Simultaneous Cs-corrected SEM & STEM imaging capability with atomic resolution
New high-stability side-entry specimen stage and specimen holders
Symmetrically opposed dual 100 mm2 EDX* detectors : "Symmetrical Dual SDD*"
Newly designed enclosure for optimum performance in real laboratory environments
A wide range of Hitachi advanced specimen holders*

*Option

Item		Description
Electron source		W(310) cold field emission electron source
Accelerating voltage		200 kV, 60 kV*1
Imaging resolution	STEM	0.078 nm(ADF-STEM image)
Imaging resolution	TEM	0.102 nm(lattice image)
Magnification	STEM	×20～×8,000,000
Magnification	TEM	×100～×1,500,000
Specimen stage	Specimen stage	Eucentric goniometer 5-axis stage
	Specimen size	3 mm Φ
	Specimen traverse	X, Y=±1.0 mm, Z=±0.4 mm
	Specimen tilt	α=±25°, β=±35°(Hitachi double-tilt specimen holder*1)
Aberration corrector		Hitachi in-house probe-forming spherical aberration corrector (standard equipment)
Image display	PC & OS	Windows® 7 *2
	Monitor	27-inch wide LCD panel (for standard monitor and 2nd monitor*1)
	Camera	Standard retractable camera Screen camera*1 (for viewing fluorescent screen)