Transmission Electron Microscope H-9500

State: Out of stock

User-friendly operation
•Windows®* compatible GUI design
•High specimen throughput, 1 minute for specimen exchange and 5 minutes for voltage ramp up (300 kV) and beam on.

Stable high resolution microscopy
•Point-to-point resolution of 0.18nm and lattice resolution of 0.1nm
•A stable 5-axis eucentric goniometer stage

Excellent performance reliability
•Field-proven 10-stage accelerator gun design
•High voltage resistor cable design

Valuable optional accessories
•Compatible specimen holder for use with Hitachi TEM, FIB and STEM systems
•A variety of specimen holders that provide heating, cooling and gas-injection capabilities for atomic resolution dynamic studies.

Warranty: 12 tháng

Price: Contact us

Order

Delivery time: 8h00 - 18h00 daily
Genuine product, provided width CO, CQ
03 months of free warranty for consumable and accessories
12 months of free warranty for main equipment
Accessorie's price is applied only when purchased with
main equipment
Contact us for any particular accessory's quotion

Email: info@redstarvietnam.com Every day in week

Features
Specifications
Comments

User-friendly operation

Windows® compatible GUI design. High specimen throughput, 1 minute for specimen exchange and 5 minutes for voltage

ramp up (300 kV) and beam on.

Stable high resolution microscopy

Point-to-point resolution of 0.18nm and lattice resolution of 0.1nm. A stable 5-axis eucentric goniometer stage.

Excellent performance reliability

Field-proven 10-stage accelerator gun design. High voltage resistor cable design.

Valuable optional accessories

Compatible specimen holder for use with Hitachi TEM, FIB and STEM systems.

A variety of specimen holders that provide heating, cooling and gas-injection capabilities for atomic resolution dynamic studies.

Note：Images on the FPD (flat panel display) are simulated.

Resolution		0.10 nm (lattice) 0.18 nm (point-to-point)
Accelerating voltage		300 kV, 200 kV^1, 100 kV^1
Magnification	Zoom mode	1,000 - 1,500,000×
	SA mode	4,000 - 500,000×
	Low mag mode	200 - 500×
Erectron gun	Filament	LaB₆ (DC heating)
	Filament exchange	Automated gun lift
	High voltage cable	Resistor cable
Illumination system	Lens	4-stage lens system
	Condenser aperture	Click-stop 4-openings
	Probe size	Micro mode: 0.05 - 0.2 µm (4 steps) Nano mode: 1 - 10 nm (4 steps)
	Beam tilt	±3°
Imaging system	Lens	5-stage lens system
	Focusing	Image wobbler Astigmatism correction by stigmonitor Optimum focus
	Objective aperture	Click-stop 4-openings
	Selected area aperture	Click-stop 4-openings
Erectron diffraction		Selected-area electron diffraction Nano probe electron dilfraction Convergent-beam electron diffraction
Erectron diffraction	Camera length	250 - 3,000 mm
Specimen chamber	Specimen stage	Eucentric 5-axis Hiper goniometer stage
	Specimen size	3 mmΦ
	Stage translation	X/Y = ±1 mm, Z = ±0.3 mm Motor drive by CPU control
	Specimen position display	Auto-drive, Auto-trace
	Specimen tilt	α = ±15°, β = ±15° (Hitachi double tilt specimen holder^*2)
	Anti-contamination	Cold block
	Baking function	Mild baking function
Viewing chamber	Fluorescent screen	Main screen: 110 mmΦ Focusing screen: 30 mmΦ
Viewing chamber	Optical viewer	7.5×
Camera chamber	Field selection	Full/half exposure
Camera chamber	Film	25 sheets (2 sets of film magazines)
GUI		OS: Windows XP^®
	Monitor	19 inch monitor
	Functions	Database, measurement, image processing
Digital CCD camera^*3	Camera coupling	Lens coupling
	Effective pixels	1,024 × 1,024 pixels
	A/D resolution	12 bits
Vacuum system	Electron gun	Ion pump: 60 L/s
	Column	TMP: 260 L/s
	Viewing/camera chamber	Diffusion pump: 280 L/s Fore pump: 135 L/min. × 3 sets