Kính hiển vi lực nguyên tử Dimension Icon

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Bruker’s Dimension Icon® brings the highest levels of performance, functionality, and AFM accessibility to nanoscale researchers in science and industry. Building upon the world’s most utilized large-sample AFM platform, it is the culmination of decades of technological innovation, customer feedback, and industry-leading application flexibility. The system has been designed from top to bottom to deliver the revolutionary low drift and low noise that allows users to achieve artifact-free images in minutes instead of hours. With a growing catalog of hardware and software extensions, this unmatched performance is accessible to researchers across the broadest range of applications, supporting even the most advanced and innovative research goals.

Benchmark for High Speed and High Resolution Dimension FastScan is the first-and-only high-speed tip-scanning system that achieves frames per second scan rates without compromising resolution or system performance – independent of sample size. No other high-speed AFM has the large sample access of the FastScan. Coupled with PeakForce Tapping®, the system achieves instantaneous force measurement with a linear control loop, allowing point defect dimensional and mechanical resolution, and not just on hard, flat crystals.					Point defect resolution stiffness image of calcite. 15 nm image size (Panel 1). Submolecular resolution adhesion image of iPMMA film. 100 nm image size (Panel 2). Sample courtesy of Prof. Dr. Thurn-Albrecht, Martin-Luther-Universität Halle-Wittenberg.

Completely unattended, automated, fully self-optimizing imaging of six different samples within ten minutes, yielding publication-quality results in each case.					Exceptional Productivity Every facet of the Dimension FastScan — from wide-open tip and sample access to preconfigured software settings — has been specifically engineered for trouble-free, surprisingly simple operation. Fast sample navigation, fast engaging, fast scanning, low-noise, less than 200 pm per minute of drift rate over hours, an expanded intuitive user interface, and the world-renowned Dimension platform combine to deliver an entirely new experience in AFM, while ensuring high-quality data with faster time to results and publication. FastScan users can achieve immediate high-quality results without the usual hours of expert tweaking.

More Applications and New Insights Faster Sample surveying is a common way to explore unknown samples to understand heterogeneity, unique feature characteristics, and mechanical properties. Here are the results of a FastScan sample survey, which produced a set of high-quality images ranging from high-resolution topography images of a 20 μm area to subsections 10 times smaller than the original scan. The results from one 8 minute scan are 16 megapixels of data in multiple channels, where high-resolution data is observed with clarity.					Amorphous drug formulations study, capturing 60 sites in 60 minutes. Samples courtesy M. E. Lauer, O. Grassmann, F. Hoffmann-LaRoche, Basel, Switzerland.

*Bruker's NanoScope 6 AFM controller* Leading-edge AFM controller built on an innovative high-speed, low-noise architecture for delivering unprecedented measurement performance					Powered by the NanoScope 6 AFM Controller Featuring higher speeds, lower noise, and greater AFM mode flexibility, the NanoScope 6 controller allows users to harness the full potential of our high-performance Dimension and MultiMode AFM systems. This latest generation controller provides unprecedented accuracy, precision, and versatility for nanoscale surface measurements in every application. NanoScope 6 uniquely enables Bruker AFMs to: Operate in more imaging modes than is possible with competing systems, including unique and advanced AFM modes that require complex control and analysis; Collect accurate, quantitative data for nanoelectrical and nanomechanical property measurements in every application; and Optimize and customize scanning parameters to meet even the most demanding research and industry measurement requirements.