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Kính hiển vi lực nguyên tử Dimension FastScan

Model: Dimension FastScan
Tình trạng: Liên hệ

Bảo hành: Chưa có thông tin bảo hành

Giá bán: Liên hệ

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Khung giờ giao hàng từ 8h00 - 18h00 hàng ngày.
Sản phẩm chính hãng, cung cấp CO & CQ.
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The Dimension FastScan^® atomic force microscope (AFM) system is specifically designed to scan fast without loss of resolution, loss of force control, added complexity, or additional operating costs. With FastScan you achieve immediate AFM images with the expected high resolution of a high-performance AFM. Whether you scan at >125Hz when surveying a sample to find the region of interest, or at time rates of 1-second per image frame in air or fluid, FastScan redefines the AFM experience.

Benchmark for High Speed and High Resolution Dimension FastScan is the first-and-only high-speed tip-scanning system that achieves frames per second scan rates without compromising resolution or system performance – independent of sample size. No other high-speed AFM has the large sample access of the FastScan. Coupled with PeakForce Tapping®, the system achieves instantaneous force measurement with a linear control loop, allowing point defect dimensional and mechanical resolution, and not just on hard, flat crystals.					Point defect resolution stiffness image of calcite. 15 nm image size (Panel 1). Submolecular resolution adhesion image of iPMMA film. 100 nm image size (Panel 2). Sample courtesy of Prof. Dr. Thurn-Albrecht, Martin-Luther-Universität Halle-Wittenberg.

Completely unattended, automated, fully self-optimizing imaging of six different samples within ten minutes, yielding publication-quality results in each case.					Exceptional Productivity Every facet of the Dimension FastScan — from wide-open tip and sample access to preconfigured software settings — has been specifically engineered for trouble-free, surprisingly simple operation. Fast sample navigation, fast engaging, fast scanning, low-noise, less than 200 pm per minute of drift rate over hours, an expanded intuitive user interface, and the world-renowned Dimension platform combine to deliver an entirely new experience in AFM, while ensuring high-quality data with faster time to results and publication. FastScan users can achieve immediate high-quality results without the usual hours of expert tweaking.

More Applications and New Insights Faster Sample surveying is a common way to explore unknown samples to understand heterogeneity, unique feature characteristics, and mechanical properties. Here are the results of a FastScan sample survey, which produced a set of high-quality images ranging from high-resolution topography images of a 20 μm area to subsections 10 times smaller than the original scan. The results from one 8 minute scan are 16 megapixels of data in multiple channels, where high-resolution data is observed with clarity.					Amorphous drug formulations study, capturing 60 sites in 60 minutes. Samples courtesy M. E. Lauer, O. Grassmann, F. Hoffmann-LaRoche, Basel, Switzerland.

*Bruker's NanoScope 6 AFM controller* Leading-edge AFM controller built on an innovative high-speed, low-noise architecture for delivering unprecedented measurement performance					Powered by the NanoScope 6 AFM Controller Featuring higher speeds, lower noise, and greater AFM mode flexibility, the NanoScope 6 controller allows users to harness the full potential of our high-performance Dimension and MultiMode AFM systems. This latest generation controller provides unprecedented accuracy, precision, and versatility for nanoscale surface measurements in every application. NanoScope 6 uniquely enables Bruker AFMs to: Operate in more imaging modes than is possible with competing systems, including unique and advanced AFM modes that require complex control and analysis; Collect accurate, quantitative data for nanoelectrical and nanomechanical property measurements in every application; and Optimize and customize scanning parameters to meet even the most demanding research and industry measurement requirements.