Luminar 4020 ThinFilm Analyzer

State: Out of stock

The Luminar 4020 AOTF-NIR Analyzer is designed for non-contact, non-distructive measurements of chemical and physical properties on wide ranges of sub-strates and coatings. The analyzer is totally insensitive to ambient light, which eases installation requirements in the production environment. An optical design eliminates the interference fringes making the measurement of thin films now possible using this patented on-line spectrometer.

Warranty: No warranty infomation

Price: Contact us

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Delivery time: 8h00 - 18h00 daily
Genuine product, provided width CO, CQ
03 months of free warranty for consumable and accessories
12 months of free warranty for main equipment
Accessorie's price is applied only when purchased with
main equipment
Contact us for any particular accessory's quotion

Email: info@redstarvietnam.com Every day in week

Features
Specifications
Downloads
Comments

● Miniaturized Design Includes Optical Module and Scaled-Down Electronics Mounted on the Optical Module

● No Moving Parts

● Dual-Beam, Pre-Aligned Lamp Assembly, InGaAs Detectors

● Fast Scanning Speed - 16,000 Wavelengths per Second

● Brimrose SNAP32! Analytical Software

Spectrometer Name	Luminar 4020 Miniature Integrated Film Analyzer
Spectral Range Options	600-1100nm, 850-1700 nm, 900-1800 nm, 1100-2300 nm
Measurement Modes	Transmission
Spectral Resolution	2-10nm
Wavelength Accuracy	± 0.5 nm
Wavelength Repeatability	± 0.01 nm
Wavelength Increment	Software Selectable 1-10 nm
Ambient Light Rejection	> 106
Signal Digitalization	16-bitA/D(1 part in 65,536)
Non-Linearity	0.1%
Sampling Speed	16,000 wavelength/sec
Sampling Area	Ø10 mm
Working Distance	6 mm ± 0.5 mm (from reflecting surface to window flange)
Process Control	Upto 16 A/D, 16 D/A Channels and 16 I/O Channels accessed via MACRO language, D/A outputs can be supplied as isolated 4-20 mA current loop outputs - Modbus capability (optional) (RS 422/485)
Diagnostic	10Built-in monitoring sensors
Thickness Range	Typical 0-15 µm (standard) (above 15 µm it is possible to use models 4030 and 7030)
Permissible Sheet Flutter	±5mm and ±2 degrees
Power Requirements	24VDC, 80 Watts or 100-240 VAC, 50/60 Hz, 90 Watts
Software Package	Windows-based analytical software for data acquisition

Options:
Ø Input/OutputCapability Ø Battery Operation Ø Wireless Ethernet Interface

Typical Applications:

● Measurements of Chemical Compositions and Thickness of Film and Coating on Film
● Coating Material: Acrylic, Epoxy, Epoxy-Phenolic, Epoxy-Urea, Multi-layer Films and Tapes, Nitrocellulose, Polyesters, Polystyrene, Vinyl, etc.
● Substrates: Aluminum Foil, Copper Clad Sheet, Metalized Polymer Films, Tin Plate, Polymer Films, etc.
● Film Thickness and Residual Solvents Measured On-Line
● Measurement of Coating Thickness of Organic Lacquer or Lubricant on Metallic Foils
● Transdermal Patch Properties Analysis

Options / Attachements:

● Input/Output Capability
● Battery Operation
● Wireless Communication

Other Materials that need to be specified:

● Wavelength Ranges
● Refraction Index of Sample

To be ordered separately:

● Wireless Ethernet Communication
● Input/Output Capability
● IQ/OQ Documents
● PERFTEST Software
● NIRPQMS Additional Software Package (21 CFR 11 Compliant)
● Training and Installation Support

Luminar_4020_brochure_EN