The absolute reflectance measurement system automates the measurement of the spectral properties, film thickness, angle variation or other characteristics of solid samples such as semiconductors, thin films and various optical elements. Coupled with the JASCO V-7000 UV/Vis/NIR Spectrophotometers, the system enables measurements of challenging samples wiith dramatically reduced noise and excellent photometric stability. The incidence and collection angles can be set in a synchronous mode, simultaneously rotating the sample stage and integrating sphere. Alternatively, the incidence and collection angles can be individually declared in an asynchronous mode. The polarization properties of a sample can be examined using P or S polarization or by setting the desired polarization angles.

• PC control of instrument conditions such as incidence and collection angles and spectrum measurement parameters.
• Wide range of instrument wavelengths, from the ultraviolet to near infrared region.
• Superior photometric stability using double-beam optical configuration.
• Individual control of incidence and collection angles.
• Standard polarization measurement capability.
• Purpose-built sample holder simplifies loading/removal of samples