The FT/IR-4700 was designed to provide operational features and sensitivity levels found only in more expensive instruments. The innovative technology incorporated in these instruments results in exceptionally high signal-to-noise ratio specifications. The FT/IR-4700 offers exceptional flexibility and can be easily upgraded to meet new requirements. Optional expandability includes microanalysis with an FT-IR microscope, IR imaging with a multichannel microscope, and rapid scan option. The JASCO Quick Start System enables users of all experience levels to measure samples and perform data processing functions quickly and easily with a simple push of a button.

Features:

Wave Number Extension
The FT/IR-4700 can mount two detectors inside of the main unit and then switch between them using software control. The standard working range, 7800 to 350 cm^-1 (mid-infrared) can be modified to cover the NIR (15000 to 2200 cm^-1) or Far-IR (5000 to 220 cm^-1).

Execllent Signal-to-Noise Ratio

Featuring a highly stable interferometer and the AccTrac^™ DSP technology providing consistent and accurate tracking of mirror position and velocity for optimum signal-to-noise performance.

FT-IR Microscope/IR Imaging

JASCO offers FT-IR microscope which can be easily interfaced to any FT/IR-4000 or FT/IR-6000 instrument.

• IRT-5100
• IRT-5200
• IRT-7100
• IRT-7200
• Irtron µ

IQ Accessory Recognition

IQ Accessory Recognition automatically recognizes the sampling accessory when inserted into the instrument sample compartment, using the previously declared instrument parameters for spectral data acquisition. The IQ System can be programmed for any commercially available sampling accessory.