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ATR-5000-SD/SS/SG
Red Star Vietnam Co., Ltd.
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ATR-5000-SD/SS/SG

State: In stock
The “Clear-View” series of Micro FT-IR ATR objectives for the IRT-5000/7000, the ATR-5000-SD (with diamond crystal), ATR-5000-SS (with zinc sulfide crystal) and ATR-5000-SG (with germanium crystal) are available for micro ATR measurements
Warranty: No warranty infomation


Price: Contact us




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  • Delivery time: 8h00 - 18h00 daily
  • Genuine product, provided width CO, CQ
  • 03 months of free warranty for consumable and accessories
  • 12 months of free warranty for main equipment
  • Accessorie's price is applied only when purchased with
    main equipment
  • Contact us for any particular accessory's quotion
Email: info@redstarvietnam.com Every day in week

The “Clear-View” series of Micro FT-IR ATR objectives for the IRT-5000/7000, the ATR-5000-SD (with diamond crystal), ATR-5000-SS (with zinc sulfide crystal) and ATR-5000-SG (with germanium crystal) are available for micro ATR measurements. These three objectives permit both ATR data collection and viewing of the sample by using the same cassegrain elements, simply changing the crystal position up and down. In addition, the ATR-5000-SD and ATR-5000-SS enables a simultaneous sample view even during ATR data collection after the ATR crystal element contacts the sample, a capability that conventional ATR objectives cannot provide. This innovative function allows you to select a specific area of the sample, while observing the entire area of the sample that is in contact with the crystal element.

 

Multi-point ATR measurement of fingernail polish using the ATR-5000-SS

Figure 1 is the sample image of fingernail polish applied to a flat metal substrate, as viewed through the ATR-5000-SS with the crystal in the raised, or view, position. The fingernail polish is impregnated with 'glitter' particles, which provide a highlight in the fingernail polish. 
Figure 2 is the sample image after contact of the ATR crystal with the sample surface. The green squares indicate the sampling points to be measured with the multi-point ATR method. While viewing the sample area during contact with the ATR crystal, specific sample sites can be selected without removing the crystal from the sample surface or switching to another objective.
The JASCO IQ Mapping software allows single-point, multi-point, line mapping or grid mapping measurements of any sample in contact with the ATR objective without moving the sample stage or ATR objective. Conventional ATR objectives can only provide sample measurements at the immediate center of the crystal, requiring movement of the ATR objective and sample stage for data collection of multiple sampling sites.
Figure 3 illustrates the sample spectra results using the IQ Mapping function. The 'Base' area provides a spectrum of the polish pigment and the 'glitter' area spectrum indicates a silica compound as the major component of the glitter particle.

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