Máy đo và phân tích bề mặt để bàn Bruker ContourX-200

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12 months of free warranty for main equipment
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The ContourX-200 Optical Profilometer provides the perfect blend of advanced characterization, customizable options, and ease of use for best-in-class fast, accurate, and repeatable non-contact 3D surface metrology. The gage-capable, small footprint system offers uncompromised 2D/3D high-resolution measurement capabilities using a larger FOV 5 MP digital camera and new motorized XY stage. Boasting unmatched Z-axis resolution and accuracy, the ContourX-200 provides all the industry recognized advantages of Bruker’s proprietary white light interferometry (WLI) technology without the limitations of conventional confocal microscopes and competing standard optical profilers.

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Hệ thống đo lường vô song

Built upon over four decades of proprietary WLI innovation, the ContourX-200 optical profilometer exhibits the low noise, high-speed, accuracy, and precision results that quantitative metrology requires. With the use of multiple objectives and integrated feature recognition, features can be tracked over a variety of fields of view and at sub-nanometer vertical resolution, providing scale-independent results for quality control and process monitoring applications in very diverse industries. ContourX-200 is robust in all surface situations from 0.05% to 100% reflectivity. New hardware features include an innovative stage design for larger stitching capabilities and a 5MP camera with a 1200x1000 measurement array for lower noise, larger field-of-view, and higher lateral resolution.

WLI cung cấp độ phân giải dọc liên tục và tối ưu cho tất cả các mục tiêu.

ContourX-200 motorized stage.

Widest Application Analysis Capabilities

Utilizing powerful VisionXpress and Vision64 user interfaces, the ContourX-200 offers thousands of customized analyses for productivity in labs and on the factory floors. Bruker’s new Universal Scanning Interferometry (USI) measurement mode provides fully automated, self-sensing surface texture, optimized signal processing while delivering the most accurate and realistic computation of the surface topography being analyzed. The larger FOV provided by the system’s new camera and flexibility afforded by the new motorized XY stage enables more flexibility and higher throughput for a broad range of samples and parts. The hardware and software combine to provide streamlined access to top optical performance, completely outclassing comparable metrology capabilities.

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Cơ khí chính xác Giữ kết cấu bề mặt và kích thước hình học của các bộ phận cơ khí chính xác. Các hệ thống của chúng tôi cung cấp phản hồi và báo cáo hiệu quả khi bạn giám sát, theo dõi và đánh giá các quy trình cũng như đánh giá theo tiêu chuẩn của GD&T.	MEMS và cảm biến Thực hiện các phép đo độ sâu tẩm thực, độ dày màng, độ cao bậc và độ nhám bề mặt với thông lượng cao, độ lặp lại cao, cũng như phép đo kích thước tới hạn tiên tiến cho MEMS và MEMS quang học. Thiết bị đo quang học có thể đo trực tiếp các thiết bị trong suốt quá trình sản xuất từ tấm wafer đến kiểm tra đầu cuối và thậm chí đo qua bao bì trong suốt.	Orthopedics/Ophthalmics Obtain precise, repeatable measurements of implant materials and components through the complete product life cycle. Our WLI optical profilers support R&D, QA, and QC analyses, for applications ranging from characterization of surface parameters of lens and injection molds to surface finish verification and wear of medical devices.

Tribology Measure, analyze, and control the impact of friction, wear, lubrication, and corrosion on material/component performance and lifespans. Determine quantitative wear parameters and perform fast pass/fail inspections on the widest range of shiny, smooth, or rough surfaces.	Semiconductors Improve yield and reduce costs for both front- and back-end manufacturing processes with automated, non-contact, wafer-scale metrology systems. Perform post-CMP die flatness inspection; bump height, coplanarity, and defect identification and analysis; and measure the critical dimensions of component structures.	Optics Better understand the root causes of defects and optimize polishing and finishing processes with accurate and repeatable sub-nm roughness measurements. Our non-contact metrology systems enable compliance with increasingly stringent specifications and ISO norms for samples ranging from small aspheric and free-form optics, to optical components with complex geometries, to diffraction gratings and microlenses.