Overview

● Best-in-class resolution in a compact system.

   The FlexSEM has employed a newly designed electrical optical system and reliability-proven high-sensitivity detector,

   achieving imaging at 4 nm.

● Novel low vacuum technologies enable observation of non-conductive specimens without preprocessing.

● The user interface is easy to operate even by novice users, and with the various automated functions,

   high-quality and quick data acquisition can be accomplished regardless of user experience level.

   Specifically, the new and enhanced navigation function, SEM MAP, helps locate the regions of interest quickly,

   and delivers accurate correlated optical and SEM images using only one click.

Features

COMPACT SLIM BODY

A compact design (450 mm wide) minimizes system footprint. The Main unit can be separated from the Power Supply unit for flexible system placement. Requires only a standard wall outlet for power.

UNPARALLELED IMAGE QUALITY

The newly developed electron optical column or Ultra Variable-Pressure Detector (UVD) enables superior imaging of specimen surfaces at low accelerating voltages and low vacuum conditions.

INTUITIVE OPERATION

The user-friendly GUI as well as accurate and fast AFC (Auto Focus Control) and ABCC (Auto Brightness and Contrast Control) algorithms, which take only 5sec, enable optimized imaging performance with minimal time and effort.

NEW CAMERA NAVIGATION - "SEM MAP"

The "SEM MAP" function makes traversing across an entire specimen effortless. Navigate your sample with the use of an optical camera, and deliver accurate correlated Optical and SEM images using only one click.