The EMV-200 electric field modulation spectrophotometer is capable of measuring changes in absorbance in the ultraviolet, visible and near-infrared region caused by application of an electrical field (several 100 V/µm) to film samples of optical performance materials. This system can perform quantitative measurement of changes in the dipole moment or polarizability and other characteristic sample parameters as a result of electronic excitation. This instrument is expected to extend the application to the evaluation of organic electro-luminescent (EL) materials, organic optical conversion molecules, and other molecular electronics elements. Furthermore, it will contribute to the elucidation of structures and functions related to optical excitation.
| Optics | Double beam |
| Wavelength range | 190 - 3200 nm |
| Band width | 0.1 - 10 nm (0.2 - 20 nm in NIR) |
| Measurement mode | Abs., %T, Single beam, Electro-absorption (Iw/IDC, I2w/IDC) |
| Frequency | 40 Hz, 100 Hz, 1 kHz, 10 kHz, 100 kHz |
| Modulation voltage | 0 - 300 V |
| Detector | PMT, Cooled InSb |
| Sample holder (option) | Variable angle incidence (0° - 50°), Single reflection measurement unit |
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