Webinar and Remote Workshop Series Failure Analysis with SEM

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You are cordially invited to join our upcoming online event:

Webinar and Remote Workshop Series Failure Analysis with SEM

Jointly brought to you by:

8th July 2021, Thursday (2pm – 4pm, UTC +8)

Click Here To Register

Pre-SEM specimen preparation techniques and know-how
Live introduction and demonstration of Ion Milling and various preparation tools (by Quasi-S Pte Ltd)

9th July 2021, Friday (2pm – 4pm, UTC +8)

Click Here To Register

Principles of Scanning Electron Microscopes and application on Failure Analysis
Live demonstration of Hitachi SU3800 SEM with various electronics and material specimens (by Hitachi High-Tech Singapore Pte Ltd.)

15th July 2021, Thursday (2pm – 4pm, UTC +8)

Click Here To Register

Analysis of semiconductor devices with Oxford Extreme EDS and Symmetry CMOS EBSD (by Oxford Instruments Singapore Pte Ltd.)

16th July 2021, Friday (2pm – 4pm, UTC +8)

Click Here To Register

Live demonstration of EDS and EBSD on interconnect of micro packaging devices (by Oxford Instruments Singapore Pte Ltd).

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