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FISCHERSCOPE® X-RAY XDV®-µ SEMI

State: Out of stock
Hands-free X-Ray metrology solution for microstructure measurements of 2.5D and 3D wafer packaging applications.
Warranty: No warranty infomation


Price: Contact us




Order
  • Delivery time: 8h00 - 18h00 daily
  • Genuine product, provided width CO, CQ
  • 03 months of free warranty for consumable and accessories
  • 12 months of free warranty for main equipment
  • Accessorie's price is applied only when purchased with
    main equipment
  • Contact us for any particular accessory's quotion
Email: info@redstarvietnam.com Every day in week
  • Hands-free operation, fully automated measurement process under well-defined constant metrology conditions
  • Industry-leading polycapillary optics for microspot measurement on structures as small as 10 µm
  • Very high detector sensitivity and resolution provide precise results
  • Automatic recognition of measurement structures and shift-compensation of measurement spot
  • Easy and intuitive system software
  • Service and maintenance friendly design
  • Designed to work under clean room conditions
  • Automated and manual measurements possible with the same instrument

 

 

Typical fields of application

 

  • Layer thickness and compositional analysis
  • Under-bump metallization (UBM) down to the nm scale
  • C4 solder bumps and smaller
  • Lead-free solder caps on copper pillars
  • Ultra small landing pads and other advanced 2.5D/3D packaging solutions
  • Đánh giá sản phẩm:

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