• Premium model with universal application characteristics
• Highest excitation flexibility, for both the size of the measurement spot and the spectral composition
• With the silicon drift detector, even very high intensities> 100 kcps can be processed without a loss in energy resolution
• Very low detection limits and excellent repeatability
• Large and easily accessible measurement chamber
• Automated series testing with fast, programmable XY-stage

Typical fields of application

• Inspection of very thin coatings, e.g. in the electronics and semiconductor industries
• Trace analysis, e. g. detection of harmful substances, according to RoHS, toy standards, packaging standards
• Gold and precious metal analysis with highest precision
• Photovoltaic industry
• Measurement of thickness and composition of NiP-layers