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03 months of free warranty for consumable and accessories
12 months of free warranty for main equipment
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Features
Specifications
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The ContourX-100 Optical Profilometer sets a new benchmark for accurate and repeatable non-contact surface metrology at a best-in-class price point. The small footprint system offers uncompromised 2D/3D high-resolution measurement capabilities in a streamlined package that incorporates decades of proprietary Bruker white light interferometry (WLI) innovation. Next-generation enhancements include a new 5 MP camera and updated stage for larger stitching capabilities, and a new measurement mode, USI, for even greater convenience and flexibility for precision machined surfaces, thick films, and tribology applications. You will not find a benchtop system with better value than the ContourX-100.

Features

Unparalleled Metrology

The ContourX-100 profiler is the culmination of over four decades of proprietary optical innovation and industry leadership in non-contact surface metrology, characterization, and imaging. The system utilizes 3D WLI and 2D imaging technology for multiple analyses in a single acquisition. ContourX-100 is robust in all surface situations from 0.05% to 100% reflectivity.

WLI offers constant and ultimate vertical resolution for all objectives.

ContourX-100 manual stage.

Unmatched Value and Analysis

With thousands of customized analyses and Bruker’s simple and powerful VisionXpress™ and Vision64® user interfaces, the ContourX-100 benchtop is optimized for productivity in both labs and on factory floors. The hardware and software combine to provide streamlined access to top high-throughput optical performance, completely outclassing comparable metrology technologies.

Surface-Independent Metrology with Application-Specific Solutions


Precision Engineering Keep the surface texture and geometric dimensions of precision-engineered parts within tight specification limits. Our gage-capable measurement systems provide efficient feedback and reporting as you monitor, track, and evaluate processes and assess GD&T conformance.	MEMS and Sensors Perform high-throughput, highly repeatable etch depth, film thickness, step-height, and surface roughness measurements, as well as advanced critical dimension metrology of MEMS and optical MEMS. Optical profiling can characterize devices throughout the manufacturing process from wafer to final test, and even through transparent packaging.	Orthopedics/Ophthalmics Obtain precise, repeatable measurements of implant materials and components through the complete product life cycle. Our WLI optical profilers support R&D, QA, and QC analyses, for applications ranging from characterization of surface parameters of lens and injection molds to surface finish verification and wear of medical devices.

Tribology Measure, analyze, and control the impact of friction, wear, lubrication, and corrosion on material/component performance and lifespans. Determine quantitative wear parameters and perform fast pass/fail inspections on the widest range of shiny, smooth, or rough surfaces.	Semiconductors Improve yield and reduce costs for both front- and back-end manufacturing processes with automated, non-contact, wafer-scale metrology systems. Perform post-CMP die flatness inspection; bump height, coplanarity, and defect identification and analysis; and measure the critical dimensions of component structures.	Optics Better understand the root causes of defects and optimize polishing and finishing processes with accurate and repeatable sub-nm roughness measurements. Our non-contact metrology systems enable compliance with increasingly stringent specifications and ISO norms for samples ranging from small aspheric and free-form optics, to optical components with complex geometries, to diffraction gratings and microlenses.

Phạm vi quét tối đa	≤10 mm
Độ phân giải dọc
Độ phân giải ngang	0.38 μm min (Sparrow criterion); 0.13 μm (with AcuityXR®)
Độ lặp lại độ cao bậc	<0.1% 1 sigma repeatability
Quét tối đa	37 μm/sec (with standard camera)
Khoảng phản xạ	0.05% to 100%
Độ dốc mẫu tối đa	≤40° (shiny surfaces); ≤87° (rough surfaces)
Chiều cao mẫu	≤100 mm (4 in.)
Bệ mẫu XY	150 mm (6 in.) manual stage
Lấy nét Z	100 mm (4 in.)
Đầu cảm ứng/Chức Năng Nghiêng	±6° available on stage
Mô-đun đo lường quang học	Patented dual-color LED illumination; Single-objective adapter; Optional automated or manual turret; Optional motorized or manual discrete modules
Vật kính	Parfocal: 2.5X, 5X, 10X, 20X, 50X, 115X; LWD: 1X, 1.5X, 2X, 5X,10X; TTM: 2X, 5X, 10X, 20X; Bright Field: 2.5X, w5X, 10X, 50X
Ống kính zoom có sẵn	0.55, 0.75X, 1X 1.5X, 2X
	Monochrome (standard) or color (optional); 5 MP with 1200x1000 data array
Máy ảnh	Vision64 and VisionXpress Analysis Software on Windows 10 OS; 64-bit
Hệ thống phần mềm	USI; Advanced PSI; Production Mode; VisionMAP; AcuityXR®; Optical Analysis; SureVision; Film; MATLAB; SDK, TCP/IP
Gói phần mềm	Auto intensity; auto focus; auto- saving, on-fly analysis; recording in database
Tự động hóa	Via NIST/PTB traceable step height and lateral ruler standards
Hiệu chuẩn	451 mm (W) x 533 mm (D) x 754 mm (H)
Dấu chân hệ thống	60 kg
Cân nặng	12 months