Scanning Electron Microscopy (SEM) with Energy Dispersive X-Ray Analysis (EDX)
SEM provides detailed high resolution images of the sample by rastering a focussed electron beam across the surface and detecting secondary or backscattered electron signal. An Energy Dispersive X-Ray Analyser (EDX or EDA) is also used to provide elemental identification and quantitative compositional information.
SEM provides images with magnifications up to ~X50,000 allowing sub micron-scale features to be seen i.e. well beyond the range of optical microscopes.

• Rapid, high resolution imaging with identification of elements present
• Spatially resolved quantitative EDX (EDA) analysis of user defined areas on sample surface
• Characterisation of particulates and defects
• Examination of grain structure and segregation effects
• Coating thickness measurement using cross sectional imaging of polished sections.

Typical Applications
• Characterisation of material structures
• Assessment of reaction interfaces, service environment and degradation mechanisms
• Characterisation of surface defects, stains and residues on metals, glasses, ceramics and polymers
• Measurement of the thickness of layered structures, metallised layers, oxide films, composite materials using cross sectional imaging
• Particulate and contaminant analysis on and within materials.

Typical Industries using SEM/EDX
• Aerospace
• Automotive
• Materials
• Minerals
• Glass, Ceramics and Refractories
• Healthcare
• Medical Devices
• Semiconductors
• Electronics
• Telecommunication
• Pharmaceutical

Our Instruments:
• HITACHI Tabletop Microscope TM3000
• OXFORD Energive-Dispersive X-Ray Analyzer SwiftED3000
• Low Speed Diamond Wheel Saw 650 CE
• Diamond Loop Saw 875 D
• 8” Grinder and Polisher 900

Our Capabilities:
• SEM Analysis with EDX – qualitative and semi-quantitative results
• Magnification from 15x to 30,000x
• Detection element: B5 – U92