The design of the CAMSIZER XT is based on the well-proven dynamic image analysis system CAMSIZER but is optimized for finer samples (from 1 µm to 8 mm). Both improved optical resolution and new options for material feeding allow for an extended application range.
Digital image processing with patented two-camera-system (acc. to ISO 13322-2)
Wide dynamic measuring range from 1 μm to 8 mm
Measuring narrow as well as very wide size distributions within one measurement and without any adjustments such as changing lenses, re-focusing, or re-calibration
Measuring size range is 1 µm - 3 mm for the X-Jet module and 10 µm - 8 mm for the X-Fall module
Newly developed optical system with ultra-strong LEDs for highest resolution and excellent depth of field for image sharpness
Reliable detection of smallest amounts of “undersize” and “oversize”
Very short measurement time of 1 – 3 minutes
Modular system X-Change for dry and wet dispersion
Measurement results are 100% compatible to sieve analysis if required
Intuitive software
Detailed particle size analysis - results are saved in more than 1,000 size classes
Calibration in seconds
Automatic measuring procedure
Robust design, insensitive to dust and vibrations
Self-cleaning, wear-free, maintenance-free
Less time- and labor-intensive than sieve analysis or microscopy
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