Kính hiển vi lực nguyên tử NanoWizard V NanoScience
Automated quantitative nanomechanical imaging and fastest scanning of rough surfaces
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NanoWizard® V NanoScience
The NanoWizard® V combines high spatio-temporal resolution with a large scan area, flexible experiment design, and outstanding integration with advanced optical microscope systems. Its automated setup, alignment, and re-adjustment of system parameters opens new possibilities for long-term, self-regulating experiments series.
Discover the 5th Generation NanoWizard NanoScience AFM
Nanowizard® V sets a new benchmark in automation while providing a host of new technical capabilities and a degree of comfort second to none.
- Latest generation packed with novel innovations
- Proven legacy of success through an install base of nearly 1000 JPK/Bruker NanoWizard AFMs across the globe
- Supported by dedicated cantilever development for high-resolution imaging, fast scanning, and customized applications
- Intuitive V8 software environment
- Unmatched ease-of-use
- Ideal for multi-user imaging facilities
Perfected Performance and Increased Productivity
The NanoWizard V is an outstanding tool for the nanosciences, uniquely combining technical innovation with performance and user comfort.
Paving the way for new scientific discoveries
- Lowest noise scanner and detection system ensure high-resolution data and unrivalled performance
- High-speed scanning rates of up to 400 lines/sec
- Ideal for real-time investigation of dynamics
- Automation for improved productivity and maximized throughput
- High-resolution nanomechanical imaging with PeakForce-QI™, PeakForce Tapping®, PeakForce QNM,
and QI - DirectOverlay for AFM in conjunction with advanced optical microscopy
- Features the latest ExperimentPlanner and ExperimentControl options
- Widest range of accessories for environment control, electrical measurements and more
Superior Performance
- Versatile imaging from atomic lattices to large scale samples
- Largest range of add-ons
- Extended optical viewing field for AFM with tiling feature
- Optimized storage of parameters and favorite settings
- Intuitive user operation
- Standardized batch analysis routines for the generation of statistically relevant datasets
- Fully automated cantilever and detector alignment
- Capture fast dynamic processes in harsh environments
- Follow reactions across multiple time scales, from milliseconds, to seconds and minutes
Topography image of atomic lattice of mica in liquid. Image taken in closed-loop TappingMode operation on an inverted microscope. Scan size: 10 nm × 10 nm, height range: 220 pm
Topography image of hexacontane (C60H122) deposited on highly oriented pyrolytic graphite (HOPG). The image was taken in TappingMode under ambient conditions. Several monomolecular layers of hexacontane are observed. The hexacontane molecules form visible lamellar stripes within each layer. Scan size: 400 nm × 400 nm, height range: 1.04 nm
Comprehensive Nanomechanical Characterization
Bruker continuously strives to improve the nanomechanical characterization capabilities of its AFMs and to provide easy technology solutions for complex scientific endeavors.
The NanoWizard V is the ideal solution for quantifying nanomechanical properties and understanding the crucial role they play in structure, morphology, and molecular interactions.
The NanoWizard V pushes the boundaries of science, opening the AFM technology to a wider range of applications and making nanomechanical characterization faster, easier, and more accessible for users of all fields of science.
Unrivalled Capabilities
- Fast scanning and ease-of-use combined with topographic and nanomechanical imaging
- Characterization of viscoelastic properties using microrheological measurements
- Contact resonance for mechanical characterization of stiff samples (>10 GPa)
- Intuitive and powerful RampDesigner software
- Highly sensitive force control and tip-saving features
- True, real-time force curve monitoring
- Mechanical mapping combined with electrical sample characterization in a single run
New Chapter in Quantitative Imaging
PeakForce-QI, the symbiosis of PeakForce Tapping and QI mode, delivers unique quantitative nanomechanical imaging capabilities. It combines highest acquisition rates with advanced force control to deliver highest resolution, multi-parametric images. The automated setup, operation, and calibration make it simple to configure and run an experiment, and obtain top-quality images and data quickly and easily, even for non-experts.
Powerful Data Analysis
- Easy, reliable batch processing
- Flexible creation of topography images at different forces
- Zero force (contact point) imaging Image stack output of any channel from batch processing
PeakForce-QNM image of a thin film of styrene-ethylene-butylene- styrene triblock copolymer (Kraton G1652) prepared on a silicon wafer. The topography is shown at the top and the corresponding Young’s modulus is shown below. Scan size: 1 µm × 1 µm. a) Height range: 22 nm; b) Modulus range: 280 MPa
Contact resonance measurement on a layered sample consisting of aluminum, silicon and chromium. Scan size: 12 µm × 12 µm. a) Height range: 121 nm; b) Modulus range: 107 GPa
PeakForce QNM image of a blend of polystyrene (PS) and ethylene-octene copolymer. The softer ethylene-octene copolymer (~0.1 GPa) is embedded in a stiff matrix of PS (~2 GPa). Scan size: 4 µm × 4 µm. a) Height range: 80 nm; b) Adhesion range: 10 nN; c) Deformation range: 50 nm; d) Modulus range: 3 GPa
Automation and Intuitive Operation at Its Best
The NanoWizard V was designed to meet the specific needs of scientists in research and industry today. Innovative hardware and software solutions have led to increased throughput, automated measurement pro-cedures, and batch processing routines that allow scientists to focus on what’s important – their research.
Highest Level of Automation
- Automated alignment of laser detection system
- Automated cantilever calibration
- Automated multi-region imaging using HybridStage or motorized stage
- Intuitive scripting of automated experiments with ExperimentPlanner
- ExperimentControl for remote monitoring of experiments
Intuitive Operation
- Workflow-based software with fundamental ease-of-use features
- User management, ideal for multi-user facilities
- Integrated software assistance
- Single-click optical image calibration
- Integrated camera for alignment of laser detection system
- Comprehensive data processing routines
- Convenient saving of parameters and favorite settings
Software setup Latest workflow-based SPM Control Software V8 depicting DirectOverlay 2, DirectTiling and MultiScan features.
Superposition of optical images from an inverted optical microscope with AFM scans on a thin film of crytallized Poly(3-hydroxy-butyrate-co-3-hydroxyvaler-ate) (PHB/V). The background optical image was created by tiling a series of smaller images (4 × 4 images) using a motorized stage. Crossed polarizers were used to visualize the spherulitic structure of the sample. AFM phase images were acquired in TappingMode under ambient conditions. The perodic, ring-like structures seen in the AFM scans result from the continuous twisting of the crystalline lamellae, forming so-called banded spherulites. Scan size from top to bottom: 50 µm × 50 µm, 60 µm × 60 µm, 45 µm × 45 µm, 70 µm × 70 µm.
Unrivalled Flexibility by Design
The renowned tip-scanner technology and modular design of the NanoWizard V NanoScience AFM can be seamlessly integrated with advanced optical techniques.
A wide range of advanced modes and accessories make it the most flexible AFM available on the market today, enabling versatile experimental setups and environmental control.
Comprehensive Range of Add-ons and Accessories
- Broad range of temperature control accessories (-120 °C up to +300 °C)
- Scanning Thermal Microscopy (SThM)
- Magnetic Force Microscopy (MFM)
- Nanomanipulation
- Friction Force Microscopy
- Multimodal imaging
- Stretching stages
- Various fluid cells
- see accessories brochure for more options
High-Resolution Electrical Characterization
- Conductive AFM (CAFM)
- Kelvin Probe Force Microscopy (KPFM)
- Electrostatic Force Microscopy (EFM)
- Piezo Force Microscopy (PFM)
- Scanning Tunneling Microscopy (STM)
- Scanning Electrochemical Microscopy (SECM)
For Complex Experiments, from Polymers to Solar Cells
- Optimized environmental control options
- Optical accessibility of the sample, e.g., for defined illumination
- 980 nm detection laser option
- Various modes for long-term, unattended experiments
Magnetic force microscopy (MFM) on meander domains with perpendicular magnetization of a multilayer Co-Pt film on silicon. Sample courtesy Dr. V. Neu (Leibnitz IFW Dresden, Germany). Scan size: 1µm × 1µm. a) Height range: 4 nm; b) Phase range: 14.4 deg.
Kelvin Probe Force Microscopy (KPFM, dual-pass) on a DRAM (Core 2 Quad processor, Intel). Scan size: 85 μm × 85 μm. a) Height range: 68 nm; b) CPD range: 468 mV.
Conductive AFM (CAFM) of zinc oxide deposited on niobium-doped strontium titanate (bias voltage -4.0 V). Sample courtesy Prof. F. Bobba, University of Salerno, Italy. Scan size: 850 nm × 850 nm. a) Height range: 16 nm; b) Current range: 42 nA.
Piezoresponse Force Microscopy (PFM) of a ferroelectric polymer P(VDF-TrFE) on a gold back electrode on silicon. A sequence of voltage pulses (20 V) was generated from a bitmap template to write the logo into the piezoelectric polarization of the sample. Vertical PFM-phase image after patterning is shown. Scan size: 45 µm × 10 µm Phase range: 170 deg.
SECM scan of a platinum electrode on glass taken in force mapping mode. The topography image is overlaid with a vertical section through the recorded SECM current distance dependence (tip potential -0.3 V, electrode potential 0 V, 10 mM [Ru(NH3)6]3+ in 0.1 M KCl). The expected behaviour of redox-cycling (on electrode) and blocking (on glass) is clearly observed. Scan size: 15 μm × 10 μm Current range: 200 pA.
The New Benchmark for Fast Scanning of Large Samples
The NanoWizard V NanoScience platform delivers fast scanning over a large scan area. The full scan range in all three axes remains available, providing unparalleled scanning speeds and easy switching between sample features, without relocation of the sample or a reduction of imaging speed.
The Fast Scanning option is ideal for the investigation of dynamic processes, delivering the speed and accuracy necessary to study phenomena, such as crystallization, growth, melting, and domain building, in real time.
Innovative Fast Scanning Capabilities in an Automated AFM
- Improved productivity and maximized throughput for reliable statistics
- Fast z-piezo with high resonance frequency delivers fastest feedback
- Adaptive intelligence-based scanning routines enable scanning rates of up to 400 lines/sec
- NestedScanner technology provides fast scanning of corrugated samples with a z-range of up to 16.5 µm
- Active balancing allows fast scanning over large scan areas
High-Resolution Electrical Characterization
- Conductive AFM (CAFM)
- Kelvin Probe Force Microscopy (KPFM)
- Electrostatic Force Microscopy (EFM)
- Piezo Force Microscopy (PFM)
- Scanning Tunneling Microscopy (STM)
- Scanning Electrochemical Microscopy (SECM)
Stability and Highest Data Accuracy Meets Ease-of-Use
- Fast scanning with advanced closed-loop control
- Fast z-piezo equipped with capacitive sensor for highest data accuracy
- Accurate force control thanks to latest feedback technologies
- DirectDrive feature for increased cantilever excitation stability
- Batch processing and advanced data analysis routines
- Movie creator
Representative series of phase images taken in TappingMode on a thin film of Poly(3-hydroxybutyrate-co-3-hydroxyvalerate) (PHB/V). Prior to the measurements, the sample was heated to above the melting temperature and then cooled to below the melting temperature immediately before image acquisition. The images show a growth front of the crystallizing PHB/V passing through the scan area. The time difference between each of the displayed images is 18 seconds. The actual data acquisition was running at 2.5 seconds per frame. Scan size: 600 nm × 600 nm Pixel size: 512 px × 512 px Scan speed: 200 lines/sec Phase range: 20 deg.
Operating Modes
Standard Operating Modes
- Now with PeakForce-QI including PeakForce Tapping, QI and PeakForce QNM
- Including fast PeakForce Tapping and QI with nested scanner technology
- Contact mode with lateral force microscopy (LFM)
- Tapping Mode™ with PhaseImaging™
- ExperimentPlanner for designing a specific measurement workflow
- Static and dynamic force spectroscopy
- Advanced Force Mapping
Optional Modes
- Advanced spectroscopy modes such as various force clamp modes or ramp designs
- Fast scanning option with line rates of up to 200 Hz
- QI Advanced mode for quantitative data, perfect for soft samples
- ScanAsyst automated gain and setpoint adjustment in PeakForce Tapping and PeakForce-QI
- Advanced AC modes such as FM and PM with Q-control & Active Gain Control
- Microrheology in CellMech Package
- Kelvin Probe Microscopy
- MFM and EFM
- Conductive AFM
- STM
- Electrical spectroscopy modes
- Piezoresponse Microscopy for high voltages
- Electrochemistry & Scanning Electrochemistry with temperature control and optical microscopy
- NanoLithography and NanoManipulation
- NanoIndentation
- Scanning Thermal AFM
- FluidFM® solution from Cytosurge
- ExperimentControl feature for remote experiment control
- DirectOverlay 2 for combined AFM and optical microscopy
- Additional XY or Z sample movement stages available with CellHesion®, TAO and HybridStage module
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