Hysitron PI 95
Quantitative nanomechanical testing inside your transmission electron microscope
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Hysitron PI 95 TEM PicoIndenter
Bruker’s Hysitron PI 95 TEM PicoIndenter is the first full-fledged depth-sensing indenter capable of direct-observation nanomechanical testing inside a transmission electron microscope (TEM). With this side-entry instrument, it is not only possible to image the mechanical response of nanoscale materials, but also to acquire load-displacement data simultaneously. Further, an integrated video interface allows for time synchronization between the load-displacement curve and the corresponding TEM video.
Customized Solution for Your TEM
The Hysitron PI 95 has been carefully designed for compatibility with JEOL, FEI, Hitachi, and Zeiss microscopes. With this instrument it is not only possible to image the mechanical response of nanoscale materials, but also acquire quantitative mechanical data simultaneously. The integrated video interface allows for synchronization between the load-displacement curve and the corresponding TEM video.
Optimized for Nanoscale Investigation
Dark-field TEM images of a Ni nanopillar before and after compression. The high dislocation density initially observed in the pillar has disappeared upon compression. Nature Materials 7, 115-119 (2007).
The Hysitron PI 95 is uniquely suited for the investigation of nanoscale phenomena. Performing these types of studies in the TEM can provide unambiguous differentiation between the many possible causes of force or displacement transients which may include dislocation bursts, phase transformations, spalling, shear banding or fracture onset.
Unparalleled Performance
An example 1 μN scratch test: (1) Normal and lateral loads and displacements versus time and (2-5) corresponding frames from the in-situ TEM video showing the buckling of the DLC film in advance of the tip and flattening of the asperities in the tops of the grains.
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