Floor-Standing 3D Optical Profilometers ContourX-1000
Self-calibrating, fully automated solution for research and production
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ContourX-1000 3D Optical Profilometer
The ContourX-1000 floor-standing white light interferometer (WLI) makes obtaining quality 3D areal surface texture and roughness measurements easy and fast. Incorporating 30+ years of innovation and our latest proprietary software and technology, this metrology system provides the rapid time-to-results and repeatability that Bruker’s optical profilers are known for, with increased throughput and even greater operator ease.
With full automation capabilities, a straightforward user experience, and streamlined measurement setup and analysis recipes, the ContourX-1000 delivers the most accurate and precise metrology on almost any surface, by any operator, even in multi-user high-volume production facilities.
Next-Generation, Industry-Focused 3D Surface Measurement Solution
Equipped with Bruker-exclusive interferometry technology and capable of complete automation, the ContourX-1000 extends the unmatched measurement and imaging capabilities of our ContourX profilometry systems to include almost any development and production application.
Only the ContourX-1000:
- Provides fast and versatile production-floor metrology with exclusive tip/tilt head, dual-light source, and advanced automation;
- Ensures extreme accuracy and reliability with self-calibrating laser and integrated vibration isolation; and
- Integrates our most user-friendly measurement and analysis software with guided, simplified routines and recipes.
The Most Accurate and Precise Metrology on Almost Any Surface, by Any Operator
Obtaining quality 3D areal surface texture and roughness measurements is now easier and faster than ever with the ContourX-1000.
Laser Focus World visited us at SPIE Photonics West 2023 to discuss ContourX-1000’s next-generation design. Watch the video spotlight or contact us to learn more about this self-calibrated, fully-automated solution for research and production.
Latest Optical Profiling Hardware Advances
The ContourX-1000 is equipped with a variety of unique and innovative hardware. Its next-generation design enables rapid optimization and maximum reproducibility for almost any development and production application, even in high-throughput and noisy environments.
Key features include:
- Patented tip/tilt head;
- Proprietary dual-LED light source;
- Automated turret and stages;
- Selection of wafer chucks;
- Proprietary internal laser reference; and
- Integrated vibration isolation.
▲ Patented tip/tilt head (contour family brochure)
Powerful Automated Measurement and Analysis
ContourX-1000’s integrated, operator-friendly features and Advanced Production interface allow rapid collection of quality, gage-capable measurements with minimal user intervention. This eliminates the complexity, extended time-to-result, and operator inconsistencies that are inherent to manual setup, acquisition, and analysis.
Key features include:
- Automated measurement and analysis recipes;
- New one-click Advanced Find Surface with auto-focus and auto-illumination;
- Automatic determination of optimal measurement parameters with the self-adapting USI measurement mode;
- Guided VisionXpress interface;
- Automatic Pattern Alignment;
- Auto-intensity, auto-saving, auto-stitching, and more.
▲ Automation graphical user interface (GUI) with wafer map
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