Dimension XR

From point defects in liquid and stiffness maps to atomic resolution in air and conductivity maps, Dimension XR systems deliver highest resolution in all measurements. They utilize Bruker’s proprietary PeakForce Tapping technology to achieve both hard and soft matter performance benchmarks, including crystal defect resolution and molecular defects in polymers. The same technology plays an equally important role in resolving the smallest asperities on roughened glass over hundreds of images. The systems combine PeakForce Tapping with extreme stability, unique probes technology, and Bruker’s decades of experience in tip scanning innovation. The result is highest resolution imaging consistently, completely independent of sample size, weight, or medium – and for any application.

For the first time an AFM can provide complete and quantitative viscoelastic analysis of polymers at the nanoscale, probing materials at rheologically relevant frequencies, in the linear regime. Proprietary dual-channel detection, phase-drift correction, and reference frequency tracking enable a small strain measurement in the rheologically relevant 0.1 Hz to 20 kHz range for nanoscale measurements of storage modulus, loss modulus, and loss tangent that tie directly to bulk DMA.

These modes utilize FASTForce Volume to perform a force-distance spectrum in every pixel, with a user-defined dwell time. Using high data capture rates, a multitude of electrical measurements are performed during the dwell time, resulting in electrical and mechanical spectra at every pixel. DataCube modes provide full characterization in a single experiment, which is unheard of in a commercial AFM.

With a spatial resolution less than 100 nm, this mode redefines what is possible in the nanoscale visualization of electrical and chemical processes in liquid. PeakForce SECM dramatically improves, by orders of magnitude, the resolving power over traditional approaches. This enables entirely new research into energy storage systems, corrosion science and biosensors, opening the door to novel measurements on individual nanoparticles, nanophases, and nanopores. Only, PeakForce SECM provides simultaneous capture of topographic, electrochemical, electrical, and mechanical maps with nanometer-scale lateral resolution.