1nm
Spatial resolution
Nano scale resolution in SEM
>1.1sr
Highest solid angle
The solid angle indicates the geometric collection efficiency of the generated X-rays
3,200,000cps
Output count rate
Up to 3,200,000 cps output count rate. That’s around an order of magnitude faster than conventional EDS detectors
Overcome the Limitations of Conventional EDS with QUANTAX FlatQUAD
QUANTAX FlatQUAD is the EDS microanalysis system that uses the revolutionary XFlash® FlatQUAD.
This annular four-channel silicon drift detector is inserted between the SEM pole piece and sample, resulting in a very large solid angle in EDS which, alongside the unique four segment detector design, maximizes the signal collection. Extremely fast mapping at the highest output count rate (OCR) can be achieved at just moderate beam currents.
Using the ESPRIT analytical software suite, QUANTAX FlatQUAD provides unrivaled mapping performance, even for the most difficult samples.
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