Hysitron TS 75 TriboScope

Delivering quantitative, rigid-probe nanoindentation and nanotribology to atomic force microscopy

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Hysitron TS 75 TriboScope

The Hysitron TS 75 TriboScope delivers quantitative, rigid-probe nanoindentation and nanotribological characterization capabilities to Bruker’s world-leading atomic force microscopes. The Hysitron TriboScope interfaces with select Dimension and MultiMode AFMs to expand the characterization capabilities of these microscopes. By utilizing a rigid test probe, the TriboScope removes the intrinsic limitations, variability, and complexity associated with cantilever-based measurements to deliver quantitative and repeatable mechanical and tribological characterization over nanometer-to-micrometer length scales.