QUANTAX EDS for TEM
XFlash® 7T – Seeing Nano in Color: STEM EDS in TEM and SEM
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80keV
Unprecedented upper energy limit
Unequivocally identify and quantify all present elements
3
TEM-quantification models
Succeed in TEM, STEM and T-SEM with easy-to-use powerful quantification based on theoretical and experimental Cliff-Lorimer factors, as well as Zeta-factor interpolation
1 Å
Stable resolution
Map periodic structures (atom, layers) with high stability and using enhanced drift correction features
Element Analysis in Transmission Electron Microscopy on the Nanometer Scale
Flexible and easy-to-use analysis software package ESPRIT with an open user interface: you see what you do.
Off-line analysis option with individual or LAN access for student or laboratory networks.
Sophisticated most seasoned quantitative energy dispersive X-ray spectroscopy (EDS) for complete data mining includes:
- Options for quantification steps: default suggestions for easy use, indvidual setup, detailed modification and saving/reloading of recipes
- 3 different quantification approaches are covering all possible scenarios based on theoretical and experimental Cliff-Lorimer factors as well as Zeta-factors and the interpolation of missing Zeta-factors
- TEM-specific high energy element lines above 40 keV available for quantification ensuring unambiguous results
- Choice of 3 vital background models: a physical one for bulk and a physical one for thin lamellae as well as a mathematical model
- Absorption correction included in the Cliff-Lorimer quantification already
High-resolution Element Distribution Analysis of Electron Transparent Samples in TEM, STEM and SEM (T-SEM)
- Long standing expertise in EDS ensures the configuration of the best solution for your specific microscope (STEM, TEM or SEM) thanks to slim-line detector design and geometrical optimization for each microscope pole piece and EDS flange type
- Maximum collection and take-off angle allow fast and highly sensitive data acquisition
- Fast-moving stable detector stage
- A special drift correction routine for periodic features ensures successful EDS on the nanoscale
- Time resolved data acquisition for in-situ experiments suitable for saving a stream of changing data, f.e. at elevated temperatures
- Automation of data acquisition and analysis processes using the scripting and API options for generation of specific analysis jobs and batch processing
- Clean data needing no or minimal post-acquisition corrections due to avoiding mechanical and electromagnetic interference completely and avoiding or keeping to a minimum specimen tilt, absorption, shadowing and system peaks
- Most seasoned quantification for EDS data from electron transparent specimens on the market provides thorough data mining with unambiguous results
- Highest quality assistance and training due to long standing experience in TEM for using your system to its full power
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