Dimension Nexus

Intersection of high performance and unbeatable value
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Dimension Nexus™ delivers an ideal combination of data quality, experiment flexibility, and ease of use in a small-footprint system. It incorporates the milestone innovations of Bruker’s NanoScope® 6 controller and PeakForce Tapping® technology to deliver more functionality than competing systems in its class. Suitable for both routine and custom experiments and easily upgradable in the field, Dimension Nexus is both an excellent starter system and a perfect addition to any thriving AFM lab.

Provides Core Performance and Value in Every Scan

Nexus consistently generates highly accurate, repeatable, publication-ready results for a wide range of sample types in both research and industry applications.

Ensuring High Performance

Central to this system’s best-in-class capabilities is its unique combination of cutting-edge hardware, software, and accessories, including:

  • Full suite of PeakForce Tapping modes for highest resolution imaging and quantitative mechanical, electrical and chemical property mapping on the widest range of samples
  • Latest generation NanoScope 6 controller with lowest noise, highest speeds, and utmost versatility for unrivalled capabilities and ease-of-use
  • XYZ closed-loop scanner, drift-compensated bridge structure, and integrated granite base for small-sample performance on an open-access, large-sample AFM
  • Largest selection of dedicated AFM Probes optimized for specific modes and samples

High-resolution topography images of a van der Waals heterostructure showing a moiré superlattice. Images collected in torsional resonance dynamic force microscopy (TR-DFM) with a FESPA probe. Scan sizes 1×1 µm and 200×200 nm (orange box)

Start of an array of 360 trenches with an overall scan size of 90x2 µm (16384x16 px) in PeakForce Tapping with an SAA-HPI probe. Critical dimension analysis showed no scanner artifacts or tip degradation over the full range.

Start and end of an array of 360 trenches; overall scan size of 90×2 µm.

End of an array of 360 trenches with an overall scan size of 90x2 µm (16384x16 px) in PeakForce Tapping with an SAA-HPI probe. Critical dimension analysis showed no scanner artifacts or tip degradation over the full range.

Start and end of an array of 360 trenches; overall scan size of 90×2 µm.

Guaranteeing Stability

When imaging over long periods of time, Dimension Nexus exhibits minimal drift and, over long scan lengths, the system shows no scanner artifacts or tip degradation.

 

[Top] Start and end of an array of 360 trenches with an overall scan size of 90×2 µm (16384×16 px) in PeakForce Tapping with an SAA-HPI probe. Critical dimension analysis showed no scanner artifacts or tip degradation over the full range. 

[Bottom] Trench-to-trench pitch measurements across all 360 trenches, showing near-zero deviation over the entire scan range. 

Delivers Outstanding Value and Ease of Use

Nexus provides distinct advantages for researchers with early-stage labs or future plans to expand their AFM research:

  • The base configuration with programmable stage for high-throughput, multi-site measurements rapidly delivers high-quality data to address standard applications.
  • Operators of all experience levels can produce reliable results with ease-of-use features, such as streamlined sample/probe setup, ScanAsyst self-optimizing imaging, and advanced data analysis software.
  • Extensive upgrade options — unique operating modes, reliable environmental control, and powerful software integrations — ensure the system can grow with your research.

Phase image of styrene butadiene block copolymer (SBC), collected in TappingMode with an RTESPA probe. Full scan size is 5000×5000 µm, 2560×2560 px. Inset is a digital zoom showcasing the data density and level of detail retained.

Offers Future Versatility and Customization

In addition to being upgradable, Dimension Nexus is open-access to facilitate experiment customization. There is physically open access to the probe-sample junction, accommodating electrical connection attachments and other custom accessories. The NanoScope 6 controller also provides an open hardware and software platform with front-panel BNC connectors, scripting software options, and easy data import to Python for custom analyses.

Microprobers integrated with Dimension Nexus for electrical characterization of nanodevices.