Hysitron IntraSpect 360

In-situ mechanical characterization for X-Ray microscopes and synchrotron beamlines

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Hysitron IntraSpect 360

Bruker’s Hysitron IntraSpect 360 brings quantitative mechanical property characterization to X-Ray microscopes (XRM) and beamlines. This unique system can be used to perform a variety of mechanical tests such as indentation, compression, fatigue, and bending, which can then be correlated to 2D or 3D images from the host microscope.